X-ray diffraction system

The universal X-ray diffractometer SEIFERT Analytical X-Ray, XRD Space Universal

• Large sample space, large angular ranges, highest accuracy
• Powder, texture, stress and retained austenite analyses
• Optional with sample changer and external preparation space
• Fast 0D and energy-dispersive, 1D, 2D detection
• Options for grazing-incidence beam, reflectometry, thin film analyses, and high resolution
• Option with microscope camera and glass capillary optics for micro-diffraction with highest lateral resolution

The universal X-ray diffractometer SEIFERT Analytical X-Ray, XRD Charon Stress Analyzer

• XRD Charon S
  Test objects up to approximately 200 x 200 x 60 mm³ (depending on individual setup)
• XRD Charon SL
  Test objects up to approximately 300 x 300 x 80 mm³ ( (depending on individual setup)
• XRD Charon S-XL
  Test objects up to approximately 400 x 400 x 120 mm³ (depending on individual setup)

Advantages

• Large sample space, large angular ranges, highest accuracy
• Ideal for stress analysis, retained austenite analysis, simple powder and texture analysis
• Cassette system for series testing of larger sample batches
• Can be integrated into production and quality control processes

The universal X-ray diffractometer SEIFERT Analytical X-Ray, XRD Galaxy

Monochromatic scanning systems and stationary polychromatic Laue systems for orientation and inspection of single crystals, wafers, ingots, turbine blades, and solar cell blocks as stand-alone units or integrated into the production or quality control process:

• XRD Galaxy SCL
  To determine the orientation with the stationary Laue method, ingots, wafers and turbine blades, point analysis or surface scanning inspection, sample adjustment by means of microscope camera and laser
• XRD Galaxy SCD
  For diffractometric scanning orientation determination with maximum accuracy, ingots, turbine blades, and wafers, s ample adjustment by means of microscope camera and laser

The universal X-ray diffractometer span class="strong color-primary">SEIFERT Analytical X-Ray, XRD Sun

• System for fast in-situ examination of chemical reactions, phase transitions, and reaction layer growth
• Fast examination of phase transformation processes at high temperatures and/or in specifically conditioned reaction atmospheres